Many interesting phenomena emerge at cryogenic temperatures, and often, additional or new information about a sample can be obtained with temperature-dependent measurements. This variable temperature Raman microscope system is optimized for high collection efficiency and throughput, offering an automated and controlled environment for characterizing materials with standard spectroscopic techniques.
Experimental Benefits
- Explore temperature-dependent phase transitions, frequency shifts, and linewidth sharpening with precise sample temperature control
- Obtain spectra at user defined intervals through the entire range (4K – 525K). A full set can be obtained in about one hour
- Generate precise Raman maps with low thermal-mechanical drift
- Acquire a full material property profile with simultaneous temperature-dependent spectroscopic and electrical measurements
- Measure weakly emitting materials efficiently with the integrated high NA optics
Measurement Techniques
- Raman Microscopy and Imaging
- Photoluminescence Spectroscopy and Imaging
- Absorption Spectroscopy
- Electrical and Photoelectrical Transport
Specifications
| CryoRaman* | Notes | |
|---|---|---|
| Temperature Range | 4 K – 350 K | High temp (~525K) option available |
| Objective-Sample Displacement | <2 μm along optical axis <32 μm in focal plane |
across 4.2 – 350K |
| Stabilization Time | ~30 seconds | with ATSM for 50K temperature change (over full temp range) and 1200 groove/mm grating @ 532 nm |
| Sample Drift | <1 μm / degree | over full temperature range |
| <100 nm | peak to peak during stable platform temperature conditions | |
| Raman Excitation Wavelength | 532 or 785 nm | other wavelengths available upon request |
| Raman Spot Size | 380 nm | |
| Field of View | >30 μm | |
| Fluorescence Source | Quartz Tungsten Halogen | optional |
| Max Sample Size | 10 x 10 x 2.5 mm (10 grams) | larger samples can be accommodated on request |
| Nanopositioner Travel Range (XYZ) | 5 x 5 x 5 mm | |
| Spectrograph | Princeton Instruments FERGIE or IsoPlane SCT 320 | Please refer to Princeton Instruments website for detailed |
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